X-ray diffraction of multi-layer graphenes: Instant measurement and determination of the number of layers

Carbon

Volumn 78, Issue , 2014, Pages 617-621

  Huh, Seung Hun ^a  

^a Korea Institute of Ceramic Engineering and Technology (KICET)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FULL WIDTH AT HALF MAXIMUM; GRAPHENE;

GRAPHENES; INTERLAYER DISTANCE; NUMBER OF LAYERS; XRD PATTERNS;

X RAY DIFFRACTION;

EID: 84906311553     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2014.07.034     Document Type: Article

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