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Journal of Vacuum Science and Technology B

Volumn 29, Issue 1, 2011, Pages

Analysis of leakage current mechanisms in RuO2 - TiO2 - RuO2 MIM structures

(10) Racko, J a Mikolasek M a Harmatha, L a Breza, J a Hudec, B b Frohlich K b Aarik, J c Tarre, A c Granzner, R d Schwierz, F d

a SLOVAK UNIVERSITY OF TECHNOLOGY (Slovakia)

b INSTITUTE OF CHEMISTRY (Slovakia)

c UNIVERSITY OF TARTU (Estonia)

d ILMENAU UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

METAL ANALYSIS; METAL INSULATOR BOUNDARIES; MIM DEVICES; OXIDE MINERALS; TITANIUM DIOXIDE;

ADVANCED MODELING; CURRENT TRANSPORT; DEFECTS DENSITY; ENERGY DISTRIBUTIONS; LEAKAGE CURRENT MECHANISMS; METAL-INSULATOR-METAL STRUCTURES; MIM STRUCTURE; TRANSPORT OF CARRIERS;

RUTHENIUM COMPOUNDS;

EID: 84905959387 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3534022 Document Type: Conference Paper

Times cited : (9)

References (8)

1
- 42349100301
- 2 electrodes
- DOI 10.1149/1.2898184
- K. Fröhlich, M. apajna, A. Rosová, E. Dobročka, K. Hušeková, J. Aarik, and A. Aidla, Electrochem. Solid-State Lett. 1099-0062 11, G19 (2008). 10.1149/1.2898184 (Pubitemid 351555808)
- (2008) Electrochemical and Solid-State Letters , vol.11 , Issue.6
- Frohlich, K.¹ Tapajna, M.² Rosova, A.³ Dobrocka, E.⁴ Husekova, K.⁵ Aarik, J.⁶ Aidla, A.⁷

2
- 0026819795
- 0018-9383, 10.1109/16.121690
- G. A. M. Hurkx, D. B. M. Klaassen, and M. P. G. Knuvers, IEEE Trans. Electron Devices 0018-9383 39, 331 (1992). 10.1109/16.121690
- (1992) IEEE Trans. Electron Devices , vol.39 , pp. 331
- Hurkx, G.A.M.¹ Klaassen, D.B.M.² Knuvers, M.P.G.³

3
- 36849108306
- 0021-8979, 10.1063/1.1710030
- S. M. Sze, J. Appl. Phys. 0021-8979 38, 2951 (1967). 10.1063/1.1710030
- (1967) J. Appl. Phys. , vol.38 , pp. 2951
- Sze, S.M.¹

4
- 55049121692
- 0038-1101, 10.1016/j.sse.2008.07.009
- J. Racko, P. Valent, P. Benko, D. Donoval, L. Harmatha, P. Pinteš, and J. Breza, Solid-State Electron. 0038-1101 52, 1755 (2008). 10.1016/j.sse.2008.07.009
- (2008) Solid-State Electron. , vol.52 , pp. 1755
- Racko, J.¹ Valent, P.² Benko, P.³ Donoval, D.⁴ Harmatha, L.⁵ Pinteš, P.⁶ Breza, J.⁷

5
- 77957232484
- J. Racko, M. Mikolášek, A. Grmanová, L. Harmatha, J. Breza, D. Donoval, F. Schwierz, R. Granzer, and K. Fröhlich, Cent. Eur. J. Phys. 9, 230 (2011).
- (2011) Cent. Eur. J. Phys. , vol.9 , pp. 230
- Racko, J.¹ Mikolášek, M.² Grmanová, A.³ Harmatha, L.⁴ Breza, J.⁵ Donoval, D.⁶ Schwierz, F.⁷ Granzer, R.⁸ Fröhlich, K.⁹

6
- 76749083505
- 0003-6951, 10.1063/1.3310065
- G. Jegert, A. Kersch, W. Weinreich, U. Schröder, and P. Lugli, Appl. Phys. Lett. 0003-6951 96, 062113 (2010). 10.1063/1.3310065
- (2010) Appl. Phys. Lett. , vol.96 , pp. 062113
- Jegert, G.¹ Kersch, A.² Weinreich, W.³ Schröder, U.⁴ Lugli, P.⁵

7
- 59949084083
- 1071-1023, 10.1116/1.3021030
- K. Fröhlich, J. Aarik, M. apajna, A. Rosová, A. Aidla, E. Dobročka, and K. Hušková, J. Vac. Sci. Technol. B 1071-1023 27, 266 (2009). 10.1116/1.3021030
- (2009) J. Vac. Sci. Technol. B , vol.27 , pp. 266
- Fröhlich, K.¹ Aarik, J.² Apajna, M.³ Rosová, A.⁴ Aidla, A.⁵ Dobročka, E.⁶ Hušková, K.⁷

8
- 74249089904
- 1938-5862 , 10.1149/1.3122129
- O. Tonomura, T. Sekiguchi, N. Inada, T. Hamada, H. Miki, and K. Torii, ECS Trans. 1938-5862 19 (2), 739-750 (2009). 10.1149/1.3122129
- (2009) ECS Trans. , vol.19 , Issue.2 , pp. 739-750
- Tonomura, O.¹ Sekiguchi, T.² Inada, N.³ Hamada, T.⁴ Miki, H.⁵ Torii, K.⁶

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