A low temperature nonlinear optical rotational anisotropy spectrometer for the determination of crystallographic and electronic symmetries

Review of Scientific Instruments

Volumn 85, Issue 8, 2014, Pages

  Torchinsky, Darius H ^a,b   Chu, Hao ^a,b   Qi, Tongfei ^c   Cao, Gang ^c   Hsieh, David ^a,b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b California Institute of Technology   (United States)

^c UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; CRYSTALLOGRAPHY; MAGNETIC THIN FILMS; PROBES;

COMPLEMENTARY TECHNIQUES; MULTIFERROIC CRYSTALS; NONLINEAR OPTICAL SUSCEPTIBILITIES; SECOND AND THIRD HARMONICS; SEMI-CONDUCTOR SURFACES; STRONGLY CORRELATED ELECTRON SYSTEM; TECHNICAL REQUIREMENT; ULTRA LOW TEMPERATURES;

SINGLE CRYSTALS;

EID: 84905674654     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.4891417     Document Type: Article

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