Open circuit voltage fuel cell durability testing using multiple PEM MEAs

ACS Symposium Series

Volumn 1040, Issue , 2010, Pages 137-151

  Haugen, Greg ^a   Barta, Sara ^a   Emery, Mike ^a   Hamrock, Steven ^a   Yandrasits, Mike ^a  

^a 3M COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DURABILITY; OPEN CIRCUIT VOLTAGE;

CATALYST SURFACES; DEGRADATION MECHANISM; DEGRADATION RATE; DURABILITY TESTING; FLUORIDE RELEASE; MEMBRANE LAYERS; OPEN CIRCUITS;

PROTON EXCHANGE MEMBRANE FUEL CELLS (PEMFC);

EID: 84904744313     PISSN: 00976156     EISSN: 19475918     Source Type: Book Series    
DOI: 10.1021/bk-2010-1040.ch010     Document Type: Conference Paper

References (10)

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