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Volumn 108, Issue , 2013, Pages 106-111
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Investigation on the I2:CuI thin films and its stability over time
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Author keywords
Copper (I) iodide; Electrical properties; Iodine doping; Mister atomizer; Optical properties
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Indexed keywords
COPPER;
CRYSTALLITE SIZE;
ELECTRIC PROPERTIES;
ENERGY GAP;
FIELD EMISSION MICROSCOPES;
GRAIN BOUNDARIES;
IODINE;
NANOTECHNOLOGY;
OPTICAL PROPERTIES;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
THIN FILMS;
X RAY DIFFRACTION;
COPPER IODIDE;
DOPING CONCENTRATION;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
IODINE DOPING;
MISTER ATOMIZERS;
QUANTUM CONFINEMENT EFFECTS;
STRONG ORIENTATION;
VISIBLE WAVELENGTHS;
SEMICONDUCTOR DOPING;
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EID: 84904394556
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2013.02.079 Document Type: Article |
Times cited : (23)
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References (23)
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