Correcting for contact geometry in Seebeck coefficient measurements of thin film devices

Organic Electronics

Volumn 15, Issue 10, 2014, Pages 2250-2255

  Reenen, Stephan Van ^a   Kemerink, Martijn ^a,b  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

Device physics; PEDOT:PSS; Seebeck coefficient; Thermoelectric generators; Thin films

Indexed keywords

CONDUCTING POLYMERS; ELECTRODES; GEOMETRY; SEEBECK COEFFICIENT; SIGNAL TO NOISE RATIO; SYSTEMATIC ERRORS; THERMOELECTRIC EQUIPMENT; THIN FILM CIRCUITS; THIN FILM DEVICES;

CONDUCTING MATERIALS; DEVICE PHYSICS; OPTIMAL ELECTRODES; PEDOT:PSS; SEEBECK COEFFICIENT MEASUREMENT; THERMOELECTRIC GENERATORS; THERMOELECTRIC PROPERTIES; THIN-FILM GEOMETRY;

THIN FILMS;

EID: 84904363153     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2014.06.018     Document Type: Article

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