Prediction of Debye-Scherrer diffraction patterns in arbitrarily strained samples

Journal of Applied Physics

Volumn 115, Issue 17, 2014, Pages

  Higginbotham, Andrew ^a   McGonegle, David ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION PATTERNS; INTERFEROMETRY;

DIAMOND-ANVIL CELL; DYNAMIC COMPRESSION EXPERIMENT; HIGHLY STRAINED; LARGE STRAINS; NORMAL STRAIN; POLYCRYSTALLINE SAMPLES; SMALL STRAINS;

STRAIN;

EID: 84903879984     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4874656     Document Type: Conference Paper

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