Quantum control, quantum information processing, and quantum-limited metrology with trapped ions

Laser Spectroscopy - Proceedings of the 17th International Conference, ICOLS 2005

Volumn , Issue , 2005, Pages 393-402

  Wineland, D J ^a   Leibfried, D ^a   Barrett, M D ^a,b   Ben Kish, A ^a,c   Bergquist, J C ^a   Blakestad, R B ^a   Bollinger, J J ^a   Britton, J ^a   Chiaverini, J ^a   Demarco, B ^a,d   Hume, D ^a   Itano, W M ^a   Jensen, M ^a   Jost, J D ^a   Knill, E ^a   Koelemeij, J ^a   Langer, C ^a   Oskay, W ^a   Ozeri, R ^a   Reichle, R ^a   Rosenband, T ^a   Schaetz, T ^a,e   Schmidt, P O ^a,f   Seidelin, S ^a   more..

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF OTAGO   (New Zealand)

^c TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^d Physics Dept Univ of Illinois   (Mexico)

^e MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^f UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY STANDARDS; LASER SPECTROSCOPY; QUANTUM COMPUTERS; TRAPPED IONS; UNITS OF MEASUREMENT;

QUANTUM COMPUTING; QUANTUM CONTROL; QUANTUM MEASUREMENT; QUANTUM-INFORMATION PROCESSING;

QUANTUM OPTICS;

EID: 84903746021     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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