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Volumn 9, Issue 6, 2014, Pages

Measurement system for high-sensitivity LIBS analysis using ICCD camera in LabVIEW environment

Author keywords

Detector control systems (detector and experiment monitoring and slow control systems, architecture, hardware, algorithms, databases); Plasma generation (laser produced, RF, x ray produced); Plasma diagnostics interferometry; Spectrometers; spectroscopy and imaging

Indexed keywords

CAMERAS; CONTROL SYSTEMS; DETECTORS; ELECTRONICS INDUSTRY; LASER PRODUCED PLASMAS; MEASUREMENTS; SENSITIVITY ANALYSIS; SPECTROMETERS; USER INTERFACES;

EID: 84903591990     PISSN: None     EISSN: 17480221     Source Type: Journal    
DOI: 10.1088/1748-0221/9/06/P06010     Document Type: Article
Times cited : (34)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.