An atomistic description of the high-field degradation of dielectric polyethylene

Journal of Chemical Physics

Volumn 139, Issue 17, 2013, Pages

  Bealing, Clive R ^a   Ramprasad, R ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO MOLECULAR DYNAMICS SIMULATION; ELECTRICAL STRESS; HIGH VOLTAGE CABLE; HIGH-FIELD; HIGH-FIELD DEGRADATION; HOLE STATE; MICROSCOPIC MECHANISMS; TRIPLET EXCITONS;

CALCULATIONS; EXCITONS; MOLECULAR DYNAMICS;

POLYETHYLENES;

EID: 84903362122     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4824386     Document Type: Article

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