In situ X-ray diffraction studies of Pr2-xNiO 4+δ crystal structure relaxation caused by oxygen loss

Solid State Ionics

Volumn 262, Issue , 2014, Pages 918-922

  Sadykov, V ^a,b   Okhlupin, Yu ^c   Yeremeev, N ^a,b   Vinokurov, Z ^a   Shmakov, A ^a,b   Belyaev, V ^a   Uvarov, N ^c   Mertens, J ^d  

^a BORESKOV INSTITUTE OF CATALYSIS   (Russian Federation)

^b NOVOSIBIRSK STATE UNIVERSITY   (Russian Federation)

^c INSTITUTE OF SOLID STATE CHEMISTRY AND MECHANOCHEMISTRY   (Russian Federation)

^d FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

In situ XRD; Mass, conductivity and structure relaxations; Oxygen diffusion and surface chemical exchange coefficients; Oxygen loss; Praseodymium nickelates; Synchrotron radiation

Indexed keywords

DIFFUSION IN GASES; PELLETIZING; SINTERING; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

IN-SITU XRD; NICKELATES; OXYGEN LOSS; STRUCTURE RELAXATION; SURFACE CHEMICALS;

OXYGEN;

EID: 84903313216     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2014.02.001     Document Type: Article

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