Hall effect in nanowires

Journal of Applied Physics

Volumn 115, Issue 23, 2014, Pages

  Fernandes, C ^a   Ruda, H E ^a   Shik, A ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

HALL EFFECT;

BULK SAMPLES; DIFFUSION CURRENTS; HALL CONTACTS; HALL VOLTAGE; LATERAL CONTACT; ORDERS OF MAGNITUDE; SCREENING LENGTHS; THIN SEMICONDUCTOR;

NANOWIRES;

EID: 84903166208     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4884681     Document Type: Article

References (5)

1. K. Storm, F. Halvardsson, M. Heurlin, D. Lindgren, A. Gustafsson, P. M. Wu, B. Monemar, and L. Samuelson, Nat. Nanotechnol. 7, 718 (2012). 10.1038/nnano.2012.190
2. Ch. Blömers et al., Appl. Phys. Lett. 101, 152106 (2012). 10.1063/1.4759124
3. A. Shik, Electronic Properties of Inhomogeneous Semiconductors (Gordon & Breach, 1995).
4. A. I. Anselm, Introduction to Semiconductor Theory (Prentice-Hall, 1981).
5. I. T. Akhiezer, Yu. G. Gurevich, and N. Zakirov, Semiconductors 27, 349 (1993).