Characterization of sintered inkjet-printed silicon nanoparticle thin films for thermoelectric devices

Physica Status Solidi (A) Applications and Materials Science

Volumn 211, Issue 6, 2014, Pages 1301-1307

  Drahi, Etienne ^a   Gupta, Anshul ^a   Blayac, Sylvain ^a   Saunier, Sébastien ^b   Benaben, Patrick ^a  

^a Center Microelectronics De Provence Georges Charpak   (France)

^b ECOLE DES MINES DE SAINT ETIENNE   (France)

Author keywords

Raman spectroscopy; Si nanoparticles; sintering; thermoelectrics; thin film

Indexed keywords

ELECTRIC PROPERTIES; INK; NANOPARTICLES; PRINTING; RAMAN SPECTROSCOPY; RAPID THERMAL ANNEALING; SILICON; SUBSTRATES; THERMAL CONDUCTIVITY; THIN FILMS;

CHARACTERIZATION METHODS; ELECTRICAL CONDUCTIVITY; FLEXIBLE ELECTRONIC DEVICES; LOW THERMAL CONDUCTIVITY; SI NANOPARTICLES; SILICON-BASED MATERIALS; THERMOELECTRIC DEVICES; THERMOELECTRICS;

SINTERING;

EID: 84902546139     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201300180     Document Type: Conference Paper

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