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Volumn 6, Issue 13, 2014, Pages 7503-7511

Graphene as an atomically thin barrier to Cu diffusion into Si

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIFFUSION BARRIERS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; INTEGRATED CIRCUIT INTERCONNECTS; METALLIZING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 84902456002     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c3nr06771h     Document Type: Article
Times cited : (94)

References (63)
  • 8
    • 84902527435 scopus 로고    scopus 로고
    • The International Technology Roadmap for Semiconductors, 2012
    • The International Technology Roadmap for Semiconductors, http://www.itrs.net, 2012


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.