A new method of dynamic latent-variable modeling for process monitoring

IEEE Transactions on Industrial Electronics

Volumn 61, Issue 11, 2014, Pages 6438-6445

  Li, Gang ^a   Qin, S Joe ^a   Zhou, Donghua ^b  

^a University of Southern California ^*  (United States)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

Contribution plots; dynamic latent variable model; dynamic principal component analysis; process monitoring and fault diagnosis; subspace identification method

Indexed keywords

EQUIVALENCE CLASSES; FAULT DETECTION; PROCESS CONTROL; PROCESS MONITORING;

CONTRIBUTION ANALYSIS; CONTRIBUTION PLOTS; DYNAMIC PRINCIPAL COMPONENT ANALYSIS; LATENT VARIABLE MODELING; LATENT-VARIABLE MODELS; MULTIVARIATE PROCESS; SUBSPACE IDENTIFICATION METHODS; TENNESSEE EASTMAN PROCESS;

PRINCIPAL COMPONENT ANALYSIS;

EID: 84902320992     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2014.2301761     Document Type: Article

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