Raman spectroscopic study of In2S3 films prepared by spray pyrolysis

Materials Science in Semiconductor Processing

Volumn 25, Issue , 2014, Pages 137-142

  Karber E ^a   Otto, K ^a   Katerski, A ^a   Mere, A ^a   Krunks, M ^a  

^a TALLINN UNIVERSITY OF TECHNOLOGY   (Estonia)

Author keywords

Chemical spray pyrolysis; EDX; Raman spectroscopy; XRD

Indexed keywords

ANNEALING; ATMOSPHERIC TEMPERATURE; CHLORINE COMPOUNDS; ENERGY DISPERSIVE SPECTROSCOPY; FILM GROWTH; RAMAN SPECTROSCOPY; SOLAR CELLS; SPECTROSCOPIC ANALYSIS; SPRAY PYROLYSIS; STOICHIOMETRY; THIN FILMS; TWO PHOTON PROCESSES; X RAY DIFFRACTION; X RAY SPECTROSCOPY; CRACKING (CHEMICAL); CRYSTAL ATOMIC STRUCTURE; INDIUM; INDIUM SULFIDE; SOLAR ABSORBERS;

CHEMICAL SPRAY PYROLYSIS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; INTERMEDIATE-BAND SOLAR CELLS; RAMAN SPECTROSCOPIC STUDY; STRUCTURAL ORDERING; SURFACE TEMPERATURES; TWO-PHOTON ABSORPTIONS; XRD; EFFECT OF ANNEALING;

INDIUM; FILM GROWTH;

EID: 84902240607     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2013.10.007     Document Type: Article

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