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Volumn 1570 LNAI, Issue , 1999, Pages 90-100
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Meeting re-use requirements of real-life diagnosis applications
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Author keywords
[No Author keywords available]
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Indexed keywords
INDUSTRIAL APPLICATIONS;
KNOWLEDGE BASED SYSTEMS;
RESEARCH;
REUSABILITY;
X RAY PHOTOELECTRON SPECTROSCOPY;
DIAGNOSIS SYSTEMS;
DIAGNOSIS TECHNOLOGY;
DIVERSE DOMAINS;
FAULT-TREES;
INTELLIGENT DIAGNOSIS;
REAL-LIFE SYSTEMS;
RESEARCH GROUPS;
TWO-DIMENSION;
COMPUTER SOFTWARE REUSABILITY;
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EID: 84901701661
PISSN: 03029743
EISSN: 16113349
Source Type: Book Series
DOI: 10.1007/10703016_5 Document Type: Conference Paper |
Times cited : (2)
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References (9)
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