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Volumn 47, Issue 4, 2013, Pages 237-250
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Dielectric characterization of the seeds of invasive Chinese tallow tree.
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
CHEMICAL MODEL;
CHEMICAL STRUCTURE;
CHEMISTRY;
COMPUTER SIMULATION;
IMPEDANCE;
MATERIALS TESTING;
PLANT SEED;
SAPIUM;
COMPUTER SIMULATION;
ELECTRIC IMPEDANCE;
MATERIALS TESTING;
MODELS, CHEMICAL;
MODELS, MOLECULAR;
SAPIUM;
SEEDS;
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EID: 84901054241
PISSN: 08327823
EISSN: None
Source Type: Journal
DOI: 10.1080/08327823.2013.11689861 Document Type: Article |
Times cited : (8)
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References (0)
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