Resistance change modeling of sputtered thin films on flexible substrates under fatigue test

IIE Annual Conference and Expo 2010 Proceedings

Volumn , Issue , 2010, Pages

  Alzoubi, Khalid ^a   Qasaimeh, Awni ^a   Lu, Susan ^a   Sammakia, Bahgat ^a   Poliks, Mark ^b  

^a BINGHAMTON UNIVERSITY   (United States)

^b Endicott Interconnect Technologies   (United States)

Author keywords

ANN; Bending fatigue; Regression; Thin films

Indexed keywords

ELECTRIC RESISTANCE; ELECTRONICS INDUSTRY; FATIGUE TESTING; FLEXIBLE ELECTRONICS; NEURAL NETWORKS; REGRESSION ANALYSIS; THIN FILMS;

ANN; BENDING FATIGUE; ELECTRICAL RESISTANCE CHANGE; ELECTRICAL RESISTANCES; ELECTRONICS MANUFACTURING INDUSTRY; FRACTIONAL FACTORIAL DESIGNS; HIGH-VOLUME PRODUCTION; REGRESSION;

SUBSTRATES;

EID: 84901049803     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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