Cryogenic temperature measurement using Rayleigh backscattering spectra shift by OFDR

IEEE Photonics Technology Letters

Volumn 26, Issue 11, 2014, Pages 1150-1153

  Du, Yang ^a   Liu, Tiegen ^a   Ding, Zhenyang ^a   Han, Qun ^a   Liu, Kun ^a   Jiang, Junfeng ^a   Chen, Qinnan ^a   Feng, Bowen ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

cryogenics; frequency domain analysis; optical fibers; optical scattering; reflectometry; Temperature measurement

Indexed keywords

BACKSCATTERING; CRYOGENICS; FREQUENCY DOMAIN ANALYSIS; OPTICAL FIBERS; REFLECTION; REFLECTOMETERS; TEMPERATURE DISTRIBUTION;

CRYOGENIC ENVIRONMENT; OPTICAL FREQUENCY DOMAIN REFLECTOMETRY; OPTICAL SCATTERING; RAYLEIGH BACKSCATTERING; REFLECTOMETRY; SINGLE-MODE OPTICAL FIBER; TEMPERATURE RESPONSE; TEMPERATURE VARIATION;

TEMPERATURE MEASUREMENT;

EID: 84901045006     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2014.2317702     Document Type: Article

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