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Volumn 6, Issue 11, 2014, Pages 6030-6036

Controlling the nanoscale rippling of graphene with SiO2 nanoparticles

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ELECTRONIC PROPERTIES; NANOPARTICLES; SUBSTRATES;

EID: 84901036276     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c3nr06885d     Document Type: Article
Times cited : (22)

References (40)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.