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Volumn 43, Issue 22, 2014, Pages 8523-8529

Semiconducting composite oxide Y2CuO4-5CuO thin films for investigation of photoelectrochemical properties

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CHLORINE COMPOUNDS; CRYSTALLITE SIZE; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 84900538864     PISSN: 14779226     EISSN: 14779234     Source Type: Journal    
DOI: 10.1039/c4dt00719k     Document Type: Article
Times cited : (21)

References (43)
  • 23
    • 0004052887 scopus 로고
    • Siemens Analytical Instruments Inc., Madison, WI, USA
    • SAINT, Area detector integration software, Siemens Analytical Instruments Inc., Madison, WI, USA, 1995
    • (1995) SAINT, Area Detector Integration Software


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.