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Volumn 43, Issue 22, 2014, Pages 8523-8529
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Semiconducting composite oxide Y2CuO4-5CuO thin films for investigation of photoelectrochemical properties
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
CHLORINE COMPOUNDS;
CRYSTALLITE SIZE;
SCANNING ELECTRON MICROSCOPY;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
AEROSOL ASSISTED CHEMICAL VAPOR DEPOSITIONS (AACVD);
ENERGY DISPERSIVE X-RAY;
HETERO BIMETALLIC COMPLEXES;
MELTING POINT ANALYSIS;
OPTICAL BAND GAP ENERGY;
PHOTOELECTROCHEMICAL PROPERTIES;
SINGLE CRYSTAL X-RAY DIFFRACTION ANALYSIS;
UV-VISIBLE SPECTROPHOTOMETRY;
DEPOSITION;
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EID: 84900538864
PISSN: 14779226
EISSN: 14779234
Source Type: Journal
DOI: 10.1039/c4dt00719k Document Type: Article |
Times cited : (21)
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References (43)
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