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Volumn 344, Issue 6185, 2014, Pages 705-706
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Imaging crystallization
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
IMAGE RESOLUTION;
REAL TIME;
ATOMIC FORCE MICROSCOPY;
BIOMINERALIZATION;
CRYSTALLIZATION;
PRIORITY JOURNAL;
SHORT SURVEY;
SURFACE PROPERTY;
TRANSMISSION ELECTRON MICROSCOPY;
CHEMISTRY;
NOTE;
NANOPARTICLE;
SILICON DIOXIDE;
ZEOLITE;
ZSM 5 ZEOLITE;
ZSM-5 ZEOLITE;
NANOPARTICLES;
SILICON DIOXIDE;
ZEOLITES;
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EID: 84900404437
PISSN: 00368075
EISSN: 10959203
Source Type: Journal
DOI: 10.1126/science.1254259 Document Type: Short Survey |
Times cited : (15)
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References (12)
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