In situ examination of oxygen non-stoichiometry in La0.80Sr 0.20CoO3-δ thin films at intermediate and low temperatures by x-ray diffraction

Applied Physics Letters

Volumn 104, Issue 16, 2014, Pages

  Biegalski, M D ^a   Crumlin, E ^b   Belianinov, A ^a   Mutoro, E ^b   Shao Horn, Y ^b   Kalinin, S V ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON MONOXIDE; COBALT COMPOUNDS; ELECTROLYTIC REDUCTION; EPITAXIAL GROWTH; LATTICE CONSTANTS; OXYGEN; STOICHIOMETRY; THIN FILMS; X RAY DIFFRACTION;

EPITAXIAL THIN FILMS; LANTHANUM STRONTIUM COBALTITES; OXYGEN CONCENTRATIONS; OXYGEN NON-STOICHIOMETRY; OXYGEN REDUCTION REACTION; PARAMETER REDUCTION; STRUCTURAL EVOLUTION; VACANCY CONCENTRATION;

ATMOSPHERIC TEMPERATURE;

EID: 84900315135     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4873542     Document Type: Article

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