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Volumn 136, Issue 18, 2014, Pages 6684-6692

Understanding the synthetic pathway of a single-phase quarternary semiconductor using surface-enhanced Raman scattering: A case of wurtzite Cu2ZnSnS4 nanoparticles

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION; NANOPARTICLES; RAMAN SCATTERING; SURFACE SCATTERING; TIN; X RAY DIFFRACTION; ZINC; ZINC SULFIDE;

EID: 84900308006     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja501786s     Document Type: Article
Times cited : (138)

References (52)
  • 30
    • 79960069213 scopus 로고    scopus 로고
    • Dieing, T. Hollricher, O. Toporski, J. Springer: Berlin, Germany
    • Hollricher, O. In Confocal Raman Microscopy; Dieing, T.; Hollricher, O.; Toporski, J., Eds.; Springer: Berlin, Germany, 2011; Vol. 158.
    • (2011) Confocal Raman Microscopy , vol.158
    • Hollricher, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.