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Volumn 305, Issue , 2014, Pages 506-514

XPS analysis and structural and morphological characterization of Cu 2 ZnSnS 4 thin films grown by sequential evaporation

(3) Gordillo, G a Calderon C a Bartolo Perez P b

a UNIVERSIDAD NACIONAL DE COLOMBIA (Colombia)

b DEPARTAMENTO DE FÍSICA APLICADA (Mexico)

Author keywords

Raman; Thin films; XPS; XRD

Indexed keywords

CHEMICAL ANALYSIS; COPPER COMPOUNDS; ENERGY GAP; EVAPORATION; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TIN COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC COMPOUNDS;

CHEMICAL COMPOSITIONS; COMPLEMENTARY TECHNIQUES; MORPHOLOGICAL CHARACTERIZATION; PHASE IDENTIFICATION; PREPARATION CONDITIONS; RAMAN; TRANSMITTANCE MEASUREMENTS; X-RAY DIFFRACTION ANALYSES (XRD);

FILM PREPARATION;

EID: 84899927849 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2014.03.124 Document Type: Article

Times cited : (67)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.