|
Volumn , Issue , 2005, Pages 681-686
|
Highly sensitive photorefractive interferometry using external ac-field
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTRIC FIELDS;
INFRARED LASERS;
LIGHT REFRACTION;
PHOTOREFRACTIVE CRYSTALS;
ULTRASONIC APPLICATIONS;
ALTERNATING ELECTRIC FIELD;
CARBON FIBER COMPOSITE;
DETECTION OF DEFECTS;
FAST RESPONSE TIME;
HIGH SENSITIVITY;
LASER ULTRASOUND;
LASER-ULTRASOUND SYSTEM;
NEAR-INFRARED LASERS;
PHOTOREACTIVITY;
|
EID: 84899879471
PISSN: None
EISSN: 21622701
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
|
References (7)
|