A low-temperature order-disorder transition in Cu2ZnSnS4 thin films

Applied Physics Letters

Volumn 104, Issue 4, 2014, Pages

  Scragg, Jonathan J S ^a   Choubrac, Léo ^b   Lafond, Alain ^b   Ericson, Tove ^a   Platzer Björkman, Charlotte ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b UNIVERSITÉ DE NANTES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

OPEN CIRCUIT VOLTAGE; ORDER DISORDER TRANSITIONS;

CRITICAL TEMPERATURES; HIGH-QUALITY MATERIALS; LOW-TEMPERATURE ORDERING; PHOTOVOLTAICS; QUANTITATIVE INVESTIGATION; RESONANT RAMAN SCATTERING; ZN CATIONS;

TEMPERATURE;

EID: 84899789210     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4863685     Document Type: Article

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