-
2
-
-
84899696332
-
-
CACTI 5. 3
-
\CACTI 5. 3," 2008. [Online]. Available: http://quid. hpl. hp. com:9081/cacti
-
(2008)
-
-
-
3
-
-
40749160036
-
Overview of the IBM blue gene/p project
-
Jan.
-
\Overview of the IBM Blue Gene/P project," IBM J. Res. Dev., vol. 52, no. 1/2, pp. 199-220, Jan. 2008.
-
(2008)
IBM J. Res. Dev
, vol.52
, Issue.1-2
, pp. 199-220
-
-
-
4
-
-
74049087888
-
Future scaling of processor-memory interfaces
-
J. H. Ahn, N. P. Jouppi, C. Kozyrakis, J. Leverich, and R. S. Schreiber, \Future Scaling of Processor-memory Interfaces," SC, pp. 42:1-42:12, 2009.
-
(2009)
SC
, pp. 421-4212
-
-
Ahn, J.H.1
Jouppi, N.P.2
Kozyrakis, C.3
Leverich, J.4
Schreiber, R.S.5
-
5
-
-
79953093822
-
-
Ph. D. dissertation, Princeton, NJ, USA
-
C. Bienia, \Benchmarking Modern Multiprocessors," Ph. D. dissertation, Princeton, NJ, USA, 2011.
-
(2011)
Benchmarking Modern Multiprocessors
-
-
Bienia, C.1
-
6
-
-
33846535493
-
The M5 Simulator: Modeling networked systems
-
N. L. Binkert, R. G. Dreslinski, L. R. Hsu, K. T. Lim, A. G. Saidi, and S. K. Reinhardt, \The M5 Simulator: Modeling Networked Systems," MICRO, 2006.
-
(2006)
MICRO
-
-
Binkert, N.L.1
Dreslinski, R.G.2
Hsu, L.R.3
Lim, K.T.4
Saidi, A.G.5
Reinhardt, S.K.6
-
8
-
-
77953292912
-
-
M. Gebhart, J. Hestness, E. Fatehi, P. Gratz, and S. W. Keckler, \Running PARSEC 2. 1 on M5. "
-
Running PARSEC 2. 1 on M5
-
-
Gebhart, M.1
Hestness, J.2
Fatehi, E.3
Gratz, P.4
Keckler, S.W.5
-
10
-
-
84858781341
-
Cosmic rays don't strike twice: Understanding the nature of dram errors and the implications for system design
-
A. A. Hwang, I. A. Stefanovici, and B. Schroeder, \Cosmic Rays Don't Strike Twice: Understanding the Nature of DRAM Errors and the Implications for System Design," SIGARCH Comput. Archit. News, pp. 111-122, 2012.
-
(2012)
SIGARCH Comput. Archit. News
, pp. 111-122
-
-
Hwang, A.A.1
Stefanovici, I.A.2
Schroeder, B.3
-
12
-
-
84880263757
-
Adaptive reliability chipkill correct
-
X. Jian and R. Kumar, \Adaptive Reliability Chipkill Correct," HPCA, pp. 270-281, 2013.
-
(2013)
HPCA
, pp. 270-281
-
-
Jian, X.1
Kumar, R.2
-
13
-
-
47349100793
-
Multi-bit error tolerant caches using two-dimensional error coding
-
J. Kim, N. Hardavellas, K. Mai, B. Falsa, and J. Hoe, \Multi-bit Error Tolerant Caches Using Two-Dimensional Error Coding," MICRO, pp. 197-209, 2007.
-
(2007)
MICRO
, pp. 197-209
-
-
Kim, J.1
Hardavellas, N.2
Mai, K.3
Falsa, B.4
Hoe, J.5
-
14
-
-
84867504286
-
A software memory partition approach for eliminating bank-level interference in multicore systems
-
L. Liu, Z. Cui, M. Xing, Y. Bao, M. Chen, and C. Wu, \A Software Memory Partition Approach for Eliminating Bank-level Interference in Multicore Systems," PACT, pp. 367-376, 2012.
-
(2012)
PACT
, pp. 367-376
-
-
Liu, L.1
Cui, Z.2
Xing, M.3
Bao, Y.4
Chen, M.5
Wu, C.6
-
16
-
-
79960164462
-
CPPC: Correctable parity protected cache
-
M. Manoochehri, M. Annavaram, and M. Dubois, \CPPC: Correctable Parity Protected Cache," ISCA, pp. 223-234, 2011.
-
(2011)
ISCA
, pp. 223-234
-
-
Manoochehri, M.1
Annavaram, M.2
Dubois, M.3
-
17
-
-
84899702587
-
-
MICRON 2Gb: x4, x8, x16 DDR3 SDRAM
-
MICRON, \2Gb: x4, x8, x16 DDR3 SDRAM," MICRON.
-
MICRON
-
-
-
18
-
-
0033296542
-
Design methodology for a one-shot reed-solomon encoder and decoder
-
S. Morioka, \Design Methodology for a One-shot Reed-Solomon Encoder and Decoder," ICCD, pp. 60-67, 1999.
-
(1999)
ICCD
, pp. 60-67
-
-
Morioka, S.1
-
20
-
-
84858775429
-
Pay-As-You-Go: Low-overhead hard-error correction for phase change memories
-
M. K. Qureshi, \Pay-As-You-Go: Low-overhead Hard-error Correction for Phase Change Memories," MICRO, pp. 318-328, 2011.
-
(2011)
MICRO
, pp. 318-328
-
-
Qureshi, M.K.1
-
21
-
-
70449657893
-
DRAM errors in the wild: A large-scale field study
-
B. Schroeder, E. Pinheiro, and W.-D. Weber, \DRAM Errors in the Wild: A Large-scale Field Study," SIGMETRICS, pp. 193-204, 2009.
-
(2009)
SIGMETRICS
, pp. 193-204
-
-
Schroeder, B.1
Pinheiro, E.2
Weber, W.-D.3
-
22
-
-
84940424704
-
Analysis and modeling of memory errors from large-scale field data collection
-
T. Siddiqua, A. E. Papathanasiou, A. Biswas, and S. Gurumurthi, \Analysis and Modeling of Memory Errors from Large-scale Field Data Collection," SELSE, 2013.
-
(2013)
SELSE
-
-
Siddiqua, T.1
Papathanasiou, A.E.2
Biswas, A.3
Gurumurthi, S.4
-
23
-
-
84877721508
-
A study of dram failures in the field
-
V. Sridharan and D. Liberty, \A Study of DRAM Failures in the Field," SC, 2012.
-
(2012)
SC
-
-
Sridharan, V.1
Liberty, D.2
-
24
-
-
84864832751
-
LOT-ECC: LOcalized and tiered reliability mechanisms for commodity memory systems
-
A. N. Udipi, N. Muralimanohar, R. Balsubramonian, A. Davis, and N. P. Jouppi, \LOT-ECC: LOcalized and Tiered Reliability Mechanisms for Commodity Memory Systems," ISCA, pp. 285-296, 2012.
-
(2012)
ISCA
, pp. 285-296
-
-
Udipi, A.N.1
Muralimanohar, N.2
Balsubramonian, R.3
Davis, A.4
Jouppi, N.P.5
-
25
-
-
77954989143
-
Rethinking DRAM design and organization for energy-constrained multi-cores
-
A. N. Udipi, N. Muralimanohar, N. Chatterjee, R. Balasubramonian, A. Davis, and N. P. Jouppi, \Rethinking DRAM Design and Organization for Energy-Constrained Multi-Cores," ISCA, pp. 175-186, 2010.
-
(2010)
ISCA
, pp. 175-186
-
-
Udipi, A.N.1
Muralimanohar, N.2
Chatterjee, N.3
Balasubramonian, R.4
Davis, A.5
Jouppi, N.P.6
-
26
-
-
84880285110
-
Virtualized ECC: Flexible reliability in main memory
-
D. H. Yoon and M. Erez, \Virtualized ECC: Flexible Reliability in Main Memory," MICRO, pp. 285-296, 2010.
-
(2010)
MICRO
, pp. 285-296
-
-
Yoon, D.H.1
Erez, M.2
|