The influence of parameters of input probe on the error of high impedance measurement

14th Symposium on New Technologies in Measurement and Instrumentation and 10th Workshop on ADC Modelling and Testing

Volumn , Issue , 2005, Pages 25-30

  Hoja, Jerzy ^a   Lentka, Grzegorz ^a  

^a GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE MEASUREMENT; MEASUREMENTS;

AMPLIFIER GAIN; COMPLEX RATIO; HIGH IMPEDANCE; IMPEDANCE MEASUREMENT; PARASITIC CAPACITANCE; PROBE PARAMETERS; SIMULATIONS AND MEASUREMENTS;

PROBES;

EID: 84899090111     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. J. Hoja, G. Lentka: "Virtual instrument using bilinear transformation for parameter identification of high impedance objects", Measurement Science and Technology, vol. 14, no. 5, May 2003, pp. 633-642, 2003.
2. J. Hoja: "A metrological analysis of the input circuit of an impedance meter.", Metrology and Measurement Systems, vol. 10, no. 4, pp. 367-380, 2003.
3. J. Bordzilowski, K. Darowicki, S. Krakowiak, A. Krolikowska: " Impedance measurements of coating properties on bridge structures", Progress in Organic Coatings, 2003 vol. 46 s. 216-219.
4. G. Bierwagen, D. Tallman, Jungping Li, Lingyun He: "EIS Studies of Coatings in Accelerated Exposure", V International Symposium on Electrochemical Impedance Spectroscopy, Marilleva, Italy 2001, Abstracts p. 149.
5. J. Hoja, G. Lentka: "New method using bilinear transformation for parameter identification of anticorrosion coatings", Proc. XVII IMEKO World Congress. Metrology in the 3rd Millenium. Dubrovnik 2003, pp. 1482-1485.
6. J. Hoja, G. Lentka: "Virtual instrument using bilinear transformation for parameters identification of anticorrosion coating.", Proc. of the 12th IMEKO TC4 International Symposium Electrical Measurements and Instrumentation. Zagreb 2002, Part 2, pp. 512-517.
7. J. Hoja, G. Lentka: "Low cost impedance analyzer for diagnostic of nonelectrical objects.", Proc. of 11th IMEKO TC-4 Symposium. Lisbon 2001, vol. I, pp. 121 ? 124.