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Volumn 8298, Issue , 2012, Pages

Diffusion dark current in front-illuminated CCDs and CMOS image sensors

Author keywords

CCD; CMOS APS; Dark current; Diode; Image sensor

Indexed keywords

CHARGE COUPLED DEVICES; CONSUMER ELECTRONICS; DIFFUSION; DIGITAL CAMERAS; DIODES; IMAGE SENSORS; PIXELS; SENSORS;

EID: 84899081756     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.920463     Document Type: Conference Paper
Times cited : (3)

References (12)
  • 1
    • 40649092257 scopus 로고
    • The physics of charge-Coupled devices
    • Ed M.J. Howes and D.V. Morgan (Wiley; New York: )
    • C.K. Kim, "The Physics of Charge-Coupled Devices" in Charge-Coupled Devices and Systems, Ed M.J. Howes and D.V. Morgan (Wiley; New York: 1979).
    • (1979) Charge-Coupled Devices and Systems
    • Kim, C.K.1
  • 7
    • 36149004075 scopus 로고
    • Electron-hole recombination in germanium
    • R. Hall, "Electron-hole recombination in germanium," Phys. Rev., 87, pg.387 (1952).
    • (1952) Phys. Rev. , vol.87 , pp. 387
    • Hall, R.1
  • 8
    • 33748621800 scopus 로고
    • Statistics of recombination of holes and electrons
    • W. Shockley and W. Read, "Statistics of recombination of holes and electrons," Phys. Rev., 87, pp835 (1952).
    • (1952) Phys. Rev , vol.87 , pp. 835
    • Shockley, W.1    Read, W.2
  • 9
    • 84927553170 scopus 로고
    • Carrier generation and recombination in p-n junctions and p-n junction characteristics
    • C.T. Sah, R. Noyce, and W. Shockley, "Carrier generation and recombination in p-n junctions and p-n junction characteristics," Proc. IRE, 45, pp11228 (1957).
    • (1957) Proc. IRE , vol.45 , pp. 11228
    • Sah, C.T.1    Noyce, R.2    Shockley, W.3
  • 12
    • 0000190148 scopus 로고
    • Minority carrier reflecting properties of semiconductor high-low junctions
    • J.R. Hauser and P.M. Dunbar, "Minority carrier reflecting properties of semiconductor high-low junctions," Solid State Electron., 18, 715-716 (1975).
    • (1975) Solid State Electron. , vol.18 , pp. 715-716
    • Hauser, J.R.1    Dunbar, P.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.