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Volumn , Issue , 2005, Pages 315-325
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Use of parameter estimation for stereolithography surface finish improvement
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Author keywords
[No Author keywords available]
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Indexed keywords
PARAMETER ESTIMATION;
CRITICAL EXPOSURE;
ESTIMATION OF PROCESS;
INVERSE DESIGNS;
LEAST SQUARES MINIMIZATION;
PROCESS PARAMETERS;
SURFACE FINISHES;
SURFACE FROM;
FINISHING;
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EID: 84898482962
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (10)
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