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Volumn 10, Issue 4, 2014, Pages 1468-1476

Static dielectric constant from simulations revisited: Fluctuations or external field?

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84898473611     PISSN: 15499618     EISSN: 15499626     Source Type: Journal    
DOI: 10.1021/ct500025m     Document Type: Article
Times cited : (33)

References (41)
  • 22
    • 84898412231 scopus 로고    scopus 로고
    • (accessed date Feb. 27).
    • MACSIMUS; http://www.vscht.cz/fch/software/macsimus/ (accessed date Feb. 27, 2014).
    • (2014) Macsimus


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.