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Volumn , Issue , 2006, Pages 461-471

How the coupling of microwave and RF energy in materials can affect solid state charge and mass transport and result in unique processing effects

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; ELECTROMAGNETIC FIELDS; INTEGRATED CIRCUIT MANUFACTURE; MICROWAVES; SURFACE REACTIONS; TEMPERATURE CONTROL;

EID: 84898424259     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-32944-2_49     Document Type: Conference Paper
Times cited : (10)

References (20)
  • 2
    • 84898454635 scopus 로고
    • Ph.D. Thesis,University of Wisconsin-Madison
    • B. Meng, Ph.D. Thesis, Electrical Engineering, University of Wisconsin-Madison, 1995.
    • (1995) Electrical Engineering
    • Meng, B.1
  • 13
    • 84898412061 scopus 로고
    • Ph.D. Thesis, University Dortmund
    • S. Vodegel, Ph.D. Thesis, University Dortmund (1993
    • (1993)
    • Vodegel, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.