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Volumn , Issue , 2006, Pages 461-471
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How the coupling of microwave and RF energy in materials can affect solid state charge and mass transport and result in unique processing effects
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGED PARTICLES;
ELECTROMAGNETIC FIELDS;
INTEGRATED CIRCUIT MANUFACTURE;
MICROWAVES;
SURFACE REACTIONS;
TEMPERATURE CONTROL;
CONVENTIONAL FURNACE;
CONVENTIONAL HEATING;
CONVENTIONAL PROCESSING;
ENDOTHERMIC REACTIONS;
INTERNAL TEMPERATURE;
INVERTED TEMPERATURE PROFILES;
MATERIAL'S SURFACE;
PROCESSING EFFECTS;
MICROWAVE MATERIALS PROCESSING;
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EID: 84898424259
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1007/978-3-540-32944-2_49 Document Type: Conference Paper |
Times cited : (10)
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References (20)
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