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Volumn 39, Issue 7, 2014, Pages 1996-1999
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Quantitative phase microscopy with off-axis optical coherence tomography
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Author keywords
[No Author keywords available]
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Indexed keywords
OPTICS;
OPTOELECTRONIC DEVICES;
COMPLEX CONJUGATES;
INTERFERENCE COMPONENTS;
QUANTITATIVE PHASE IMAGING;
QUANTITATIVE PHASE MEASUREMENT;
QUANTITATIVE PHASE MICROSCOPIES;
SPECTRAL DOMAIN OPTICAL COHERENCE TOMOGRAPHIES;
SPECTRAL DOMAINS;
SPECTRAL INTERFEROMETRY;
OPTICAL TOMOGRAPHY;
FOURIER ANALYSIS;
MICROSCOPY;
OPTICAL COHERENCE TOMOGRAPHY;
PROCEDURES;
FOURIER ANALYSIS;
MICROSCOPY;
TOMOGRAPHY, OPTICAL COHERENCE;
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EID: 84898005884
PISSN: 01469592
EISSN: 15394794
Source Type: Journal
DOI: 10.1364/OL.39.001996 Document Type: Article |
Times cited : (8)
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References (15)
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