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Volumn 39, Issue 7, 2014, Pages 1996-1999

Quantitative phase microscopy with off-axis optical coherence tomography

Author keywords

[No Author keywords available]

Indexed keywords

OPTICS; OPTOELECTRONIC DEVICES;

EID: 84898005884     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.39.001996     Document Type: Article
Times cited : (8)

References (15)
  • 2
    • 84865752934 scopus 로고    scopus 로고
    • P. Ferraro, A. Wax, and Z. Zalevsky, eds. (Springer
    • N. T. Shaked, M. T. Rinehart, and A. Wax, in Coherent Light Microscopy, P. Ferraro, A. Wax, and Z. Zalevsky, eds. (Springer, 2011), pp. 169-198.
    • Coherent Light Microscopy , vol.2011 , pp. 169-198
    • Shaked, N.T.1    Rinehart, M.T.2    Wax, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.