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Volumn 19, Issue , 2012, Pages 1-14

Semiconductors elaboration/ZnO based varistors for improving of stability and reliability of electrical systems applications by using the Rare-Earths

Author keywords

Leakage current; Rare Earth Metals; Threshold voltage; Varistor

Indexed keywords


EID: 84897744415     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2012.05.176     Document Type: Conference Paper
Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.