A constrained random demodulator for sub-nyquist sampling

IEEE Transactions on Signal Processing

Volumn 61, Issue 3, 2013, Pages 707-723

  Harms, Andrew ^a   Bajwa, Waheed U ^b   Calderbank, Robert ^c  

^a Princeton University   (United States)

^b RUTGERS UNIVERSITY   (United States)

^c Duke University   (United States)

Author keywords

Analog to digital conversion; Compressive sensing; Random demodulator; Repetition code; Restricted isometry property; Run length limited sequences; Sub Nyquist sampling

Indexed keywords

COMPRESSIVE SENSING; RANDOM DEMODULATOR; REPETITION CODE; RESTRICTED ISOMETRY PROPERTIES; RUN LENGTH; SUB-NYQUIST SAMPLING;

ANALOG TO DIGITAL CONVERSION; MATRIX ALGEBRA; POWER SPECTRUM;

DEMODULATORS;

EID: 84897585066     PISSN: 1053587X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSP.2012.2231077     Document Type: Article

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