Reconstruction of layered dielectric media using the band-limited reflectometry

1998 28th European Microwave Conference, EuMC 1998

Volumn 2, Issue , 1998, Pages 624-627

  Mikhnev, V ^a  

^a INSTITUTE OF APPLIED PHYSICS   (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

ITERATIVE METHODS;

CO-ORDINATE TRANSFORMATION; COMPLEX REFLECTION COEFFICIENT; CONVERGENCE AND STABILITY; DIELECTRIC INTERFACE; LAYERED DIELECTRICS; LOW SENSITIVITY; MICROWAVE IMAGING; OPTICAL PATH LENGTHS;

REFLECTION;

EID: 84897568157     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1998.338226     Document Type: Conference Paper

References (3)

1. T. Uno and S. Adachi, Inverse scattering method for one-dimensional inhomogeneous layered media, 1987, IEEE Trans., vol. AP-35, pp. 1456-1466
2. T.M. Habashy, E.Y. Chow, and D.G. Dudley, Profile inversion using the renormalized sourcetype integral equation approach, 1990, IEEE Trans., vol. AP-38, pp. 668-682
3. V.A. Mikhnev and P. Vainikainen, Profile inversion of stratified dielectric media using the two-step reconstruction, Proc. of the 27th European Microwave Conf, Jerusalem, 8-12 September 1997, pp. 584-588