A 40GHz large-signal double-reflectometer waveform measurement system designed for load-pull applications

1996 26th European Microwave Conference, EuMC 1996

Volumn 2, Issue , 1996, Pages 657-661

  Van Raay, F ^a   Kompa, G ^a  

^a UNIVERSITY OF KASSEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM GALLIUM ARSENIDE;

APPLICATION EXAMPLES; ARBITRARY LOADING; FUNDAMENTAL FREQUENCIES; HARMONIC AMPLITUDE; MEASUREMENT SYSTEM; MICROWAVE TRANSITION ANALYZERS; SYSTEM CALIBRATION; WAVEFORM MEASUREMENT;

REFLECTOMETERS;

EID: 84897556062     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1996.337666     Document Type: Conference Paper

References (11)

1. Pierpoint, M.; et aL: An Automated Measurement Technique for Measuring Amplifier Load-ull and Verifying Large-Signal Device Models. IEEE MU-S Symposium Digest, USA (1986), Paper X-2, p. 625628
2. Hecht, I.: Improved Error-Correction Technique for Large-Signal Load-ull Measurements. IEEE Trans. on MUT 35 (1987), p. 1060 ff
3. Kotzebue, K.; et al.: An 18 to 26.5 GHz Waveguide Load-ull System Ussing Active-Load Tuning. IEEE MUTS Symposium Digest (1987), Paper L-3, p. 453-456
4. Takayama, Y.: A New Load-ull Characterization Method for Microwave Power Transistors. IEEE MUT-S Symposium Digest, USA (1976), p. 218-220
5. Stancliff, R.B.; Poulin, D.D.: Harmonic Load-ull. IEEE MUT-S Symposium Digest, USA (1979), p. 185187
6. Poulin, D.D.: AHigh Power On-Wafer Pulsed Active Load-ull System. IEEE MTT-S Symposium Digest, Albuquerque, New Mexico, USA (1992), Paper NN-1, p. 1431-1434
7. van Raay, F.; Kompa, G.: A New On-Wafer Large-Signal Waveform Measurement System with 40 GHz Harmonic Bandwidth. IEEE MUT-S Symposium Digest, Albuquerque, New Mexico, USA (1992), Paper NN-2,p. 1435-1438
8. Lott, U.: Measurement of Magnitude and Phase of Harmonics Generated in Nonlinear Microwave Two-orts. IEEE-MTU-S Int. Symp. Digest, USA(1988), p. 225-228
9. Sipila, M; et al.: High-Frequency Periodic Time-Domain Waveform Measurement System. IEEE Trans. on MUT 36 (1988), p. 1397-1405
10. Tasker, P.J.; et al.: Novel Approach to the Extraction of Transistor Parameters from Large Signal Measurements. Proc. of the 24th EuMC, 1994, PaperA7.1, .p. 1301-1306
11. Kompa, G.; Schlechtweg, M.; van Raay, F.: Precisely Calibrated Coaxial-to-Microstrip Transitions Yield Improved Performance in GaAs FET Characterization. IEEE Trans. on MUT 38(1990), p. 62-68.