Recognition of airport runways in FLIR images based on knowledge

IEEE Geoscience and Remote Sensing Letters

Volumn 11, Issue 9, 2014, Pages 1534-1538

  Wu, Wei ^a,b   Xia, Renbo ^c   Xiang, Wei ^c   Hui, Bin ^c   Chang, Zheng ^c   Liu, Yunpeng ^c   Zhang, Yahong ^a,b  

^a SHENYANG INSTITUTE OF AUTOMATION   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Airport runway recognition; forward looking infrared (FLIR) images; linear feature extraction; region of interest (ROI) length backtracking; texture similarity

Indexed keywords

AIRPORT RUNWAYS; FEATURE EXTRACTION;

FORWARD LOOKING INFRARED IMAGES; LINEAR FEATURE EXTRACTION; REGION OF INTEREST; RUNWAY RECOGNITION; TEXTURE SIMILARITY;

IMAGE SEGMENTATION;

EID: 84897113640     PISSN: 1545598X     EISSN: None     Source Type: Journal    
DOI: 10.1109/LGRS.2014.2299898     Document Type: Article

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