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Journal of Materials Science: Materials in Electronics

Volumn 25, Issue 4, 2014, Pages 1915-1921

Comparative studies of pure BiFeO3 prepared by sol-gel versus conventional solid-state-reaction method

(4) Sharma, Subhash a Singh, Vikash a Kotnala, R K b Dwivedi, Rakesh Kumar a

a JAYPEE INSTITUTE OF INFORMATION TECHNOLOGY (India)

b NATIONAL PHYSICAL LABORATORY (India)

Author keywords

[No Author keywords available]

Indexed keywords

BOND LENGTH; DIELECTRIC PROPERTIES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; RIETVELD REFINEMENT; SOL-GEL PROCESS; SOL-GELS; X RAY DIFFRACTION;

COMPARATIVE STUDIES; DIELECTRIC CHARACTERISTICS; FOURIER TRANSFORM INFRA REDS; LOW FREQUENCY RANGE; LOW TEMPERATURE PHASE; MULTIFUNCTIONAL PROPERTIES; SOLID-STATE ROUTES; UV-VISIBLE SPECTRA;

SYNTHESIS (CHEMICAL);

EID: 84897088709 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-014-1820-7 Document Type: Article

Times cited : (106)

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