Structural evolution during mechanical deformation in high-barrier PVDF-TFE/PET multilayer films using in situ X-ray techniques

ACS Applied Materials and Interfaces

Volumn 6, Issue 6, 2014, Pages 3987-3994

  Jordan, Alex M ^a   Lenart, William R ^a   Carr, Joel M ^a   Baer, Eric ^a   Korley, Lashanda T J ^a  

^a Case Western Reserve University   (United States)

Author keywords

biaxial orientation; confined crystallization; in situ deformation; isothermal recrystallization; mechanical properties; multilayer coextrusion; thin films

Indexed keywords

COEXTRUSION; CRYSTAL ORIENTATION; FILM PREPARATION; MECHANICAL PROPERTIES; MULTILAYER FILMS; MULTILAYERS; PACKAGING MATERIALS; RECRYSTALLIZATION (METALLURGY); STRAIN HARDENING; THIN FILMS;

BIAXIAL ORIENTATION; CONFINED CRYSTALLIZATION; CRYSTAL STRUCTURE EVOLUTIONS; POLY(ETHYLENE TEREPHTHALATE) (PET); POST-PROCESSING TECHNIQUES; SITU DEFORMATION; STRAININDUCED CRYSTALLIZATION; WIDE ANGLE X-RAY SCATTERING;

DEFORMATION;

EID: 84896927159     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am4053893     Document Type: Article

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