Scattering of roughened tco films-modeling and measurement

Optics InfoBase Conference Papers

Volumn , Issue , 2010, Pages

  Schroder, Sven ^a   Duparre, Angela ^a   Fuchsel, Kevin ^a,b   Kaiser, Norbert ^a   Tunnermann, Andreas ^a,b   Harvey, James E ^c  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^c UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT TRAPPING STRUCTURES; NEW APPROACHES; SCATTERING PROPERTY; SMOOTH SURFACE;

COATINGS; FIBER OPTIC SENSORS; LIGHT INTERFERENCE;

SCATTERING;

EID: 84896794130     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. S. Schröder, A. Duparré, A. Tünnermann, "Roughness evolution and scatter losses of multilayers for 193 nm optics," Appl. Opt. 47, C88-C97 (2008)
2. P. Beckmann, A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces, (Pergamon Press, New York, 1963)
3. J. M. Elson and J. M. Bennett, "Vector Scattering Theory," Opt. Eng. 18, 116 (1979)
4. R. Dewan, D. Knipp, "Light trapping in thin-film silicon solar cells with integrated diffraction grating," J. Appl. Phys. 106, 074901 (2009)
5. Harvey J. E., Krywonos A., Stover J. C., "Unified scatter model for rough surfaces at large incident and scatter angles," Proc. SPIE 6672, 66720C (2007)