A data-driven threshold for wavelet sliding window denoising in mechanical fault detection

Science China Technological Sciences

Volumn 57, Issue 3, 2014, Pages 589-597

  Chen, Yimin ^a   Zi, Yanyang ^a   Cao, Hongrui ^a   He, Zhengjia ^a   Sun, Hailiang ^a,b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b BEIJING INSTITUTE OF ASTRONAUTICAL SYSTEMS ENGINEERING   (China)

Author keywords

bearing fault diagnosis; data driven threshold; noise estimation; wavelet denoising

Indexed keywords

BEARINGS (MACHINE PARTS); SIGNAL PROCESSING; SPECTRAL DENSITY; WAVELET TRANSFORMS;

BEARING FAULT DIAGNOSIS; DATA DRIVEN; NOISE ESTIMATION; NOISE POWER SPECTRAL DENSITY; NONSTATIONARY SIGNALS; SLIDING WINDOW METHODS; WAVELET DENOISING; WAVELET TRANSFORMATIONS;

FAULT DETECTION;

EID: 84896527565     PISSN: 16747321     EISSN: 18691900     Source Type: Journal    
DOI: 10.1007/s11431-013-5451-7     Document Type: Article

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