Recombination stability in polycrystalline Cu2ZnSnSe4 thin films

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2013, Pages 1941-1944

  Buffiere, Marie ^a,b   Brammertz, Guy ^a   Mel, Abdel Aziz El ^c   Lenaers, Nick ^a,b   Ren, Yi ^a,b   Zaghi, Armin E ^a,b   Mols, Yves ^a   Koeble, Christine ^d   Vleugels, Jef ^b   Meuris, Marc ^a   Poortmans, Jef ^a,b  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c UNIVERSITY OF MONS   (Belgium)

^d HAHN MEITNER INSTITUT   (Germany)

Author keywords

Charge carrier lifetime; CZTSe; Solar cells; Surface properties; Thin films

Indexed keywords

CHARGE CARRIERS; SOLAR CELLS; SURFACE PROPERTIES;

AIR EXPOSURE; CHEMICAL TREATMENTS; CZTSE; EXPOSED TO; KCN ETCHING; POLYCRYSTALLINE; RECOMBINATION RATE; TIME-RESOLVED PHOTOLUMINESCENCE;

THIN FILMS;

EID: 84896445428     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2013.6744850     Document Type: Conference Paper

References (7)

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