Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry

Applied Physics Letters

Volumn 104, Issue 10, 2014, Pages

  Yim, Chanyoung ^a   O'Brien, Maria ^a   McEvoy, Niall ^a   Winters, Sinéad ^a   Mirza, Inam ^a   Lunney, James G ^a   Duesberg, Georg S ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; VAPORS;

BAND GAP ENERGY; EXTINCTION COEFFICIENTS; MOLYBDENUM DISULFIDE; OPTICAL APPLICATIONS; OPTICAL DISPERSION; TRANSITION METAL DICHALCOGENIDES; VAPOR PHASE; VAPOR PHASE SULFURIZATION;

MOLYBDENUM COMPOUNDS;

EID: 84896270614     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4868108     Document Type: Article

References (28)

1. K. S. Novoselov, D. Jiang, F. Schedin, T. J. Booth, V. V. Khotkevich, S. V. Morozov, and A. K. Geim, Proc. Natl. Acad. Sci. U.S.A. 102, 10451 (2005). 10.1073/pnas.0502848102
2. A. H. C. Neto and K. Novoselov, Mater. Express 1, 10 (2011). 10.1166/mex.2011.1002
3. K. S. Novoselov, Rev. Mod. Phys. 83, 837 (2011). 10.1103/RevModPhys.83. 837
4. Q. H. Wang, K. Kalantar-Zadeh, A. Kis, J. N. Coleman, and M. S. Strano, Nat. Nanotechnol. 7, 699 (2012). 10.1038/nnano.2012.193
5. K. F. Mak, C. Lee, J. Hone, J. Shan, and T. F. Heinz, Phys. Rev. Lett. 105, 136805 (2010). 10.1103/PhysRevLett.105.136805
6. B. Radisavljevic, A. Radenovic, J. Brivio, V. Giacometti, and A. Kis, Nat. Nanotechnol. 6, 147 (2011). 10.1038/nnano.2010.279
7. H. S. Lee, S.-W. Min, Y.-G. Chang, M. K. Park, T. Nam, H. Kim, J. H. Kim, S. Ryu, and S. Im, Nano Lett. 12, 3695 (2012). 10.1021/nl301485q
8. B. Radisavljevic and A. Kis, Nature Mater. 12, 815 (2013). 10.1038/nmat3687
9. O. Lopez-Sanchez, D. Lembke, M. Kayci, A. Radenovic, and A. Kis, Nat. Nanotechnol. 8, 497 (2013). 10.1038/nnano.2013.100
10. Y.-H. Lee, X.-Q. Zhang, W. Zhang, M.-T. Chang, C.-T. Lin, K.-D. Chang, Y.-C. Yu, J. T.-W. Wang, C.-S. Chang, L.-J. Li, and T.-W. Lin, Adv. Mater. 24, 2320 (2012). 10.1002/adma.201104798
11. Y. Zhan, Z. Liu, S. Najmaei, P. M. Ajayan, and J. Lou, Small 8, 966 (2012). 10.1002/smll.201102654
12. S. Najmaei, Z. Liu, W. Zhou, X. Zou, G. Shi, S. Lei, B. I. Yakobson, J.-C. Idrobo, P. M. Ajayan, and J. Lou, Nature Mater. 12, 754 (2013). 10.1038/nmat3673
13. M. Shanmugam, C. A. Durcan, and B. Yu, Nanoscale 4, 7399 (2012). 10.1039/c2nr32394j
14. K. Lee, R. Gatensby, N. McEvoy, T. Hallam, and G. S. Duesberg, Adv. Mater. 25, 6699 (2013). 10.1002/adma.201303230
15. W. Zhang, J.-K. Huang, C.-H. Chen, Y.-H. Chang, Y.-J. Cheng, and L.-J. Li, Adv. Mater. 25, 3456 (2013). 10.1002/adma.201301244
16. H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (John Wiley & Sons Ltd, Chichester, 2007), p. 81.
17. V. G. Kravets, A. N. Grigorenko, R. R. Nair, P. Blake, S. Anissimova, K. S. Novoselov, and A. K. Geim, Phys. Rev. B 81, 155413 (2010). 10.1103/PhysRevB.81.155413
18. F. J. Nelson, V. K. Kamineni, T. Zhang, E. S. Comfort, J. U. Lee, and A. C. Diebold, Appl. Phys. Lett. 97, 253110 (2010). 10.1063/1.3525940
19. J. W. Weber, V. E. Calado, and M. C. M. van de Sanden, Appl. Phys. Lett. 97, 091904 (2010). 10.1063/1.3475393
20. A. Matkovic, U. Ralevic, M. Chhikara, M. M. Jakovljevic, D. Jovanovic, G. Bratina, and R. Gajic, J. Appl. Phys. 114, 093505 (2013). 10.1063/1.4819967
21. TM Data Analysis Manual Version 4.63, J. A. Woollam Co., Inc., Lincoln, NE, 2011, p. 45.
22. C. M. Herzinger, B. Johs, W. A. McGahan, J. A. Woollam, and W. Paulson, J. Appl. Phys. 83, 3323 (1998). 10.1063/1.367101
23. G. E. Jellison and F. A. Modine, Appl. Phys. Lett. 69, 371 (1996). 10.1063/1.118064
24. G. Eda, H. Yamaguchi, D. Voiry, T. Fujita, M. Chen, and M. Chhowalla, Nano Lett. 11, 5111 (2011). 10.1021/nl201874w
25. H. Li, Q. Zhang, C. C. R. Yap, B. K. Tay, T. H. T. Edwin, A. Olivier, and D. Baillargeat, Adv. Funct. Mater. 22, 1385 (2012). 10.1002/adfm.201102111
26. F. P. Koffyberg, K. Dwight, and A. Wold, Solid State Commun. 30, 433 (1979). 10.1016/0038-1098(79)91182-7
27. E. R. Shaaban, M. S. Abd El-Sadek, M. El-Hagary, and I. S. Yahia, Phys. Scr. 86, 015702 (2012). 10.1088/0031-8949/86/01/015702
28. See supplementary material at http://dx.doi.org/10.1063/1.4868108 E-APPLAB-104-102410 for additional SE spectral data, fitting parameter values of the T-L oscillation model, XRR details, and plots on the optical band gap extraction.