Detection limits in XPS for more than 6000 binary systems using Al and Mg Kα X-rays

Surface and Interface Analysis

Volumn 46, Issue 3, 2014, Pages 175-185

  Shard, Alexander G ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

background; detection limit; measurement; uncertainty; XPS

Indexed keywords

EID: 84894273697     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.5406     Document Type: Article

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