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Volumn , Issue , 2003, Pages 465-468

Monolithic time-to-digital converter with 20ps resolution

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL WIDTHS; CONVERSION TIME; LINEARITY ERRORS; MONOLITHIC CIRCUITS; SINGLE-SHOT MEASUREMENTS; TIME TO DIGITAL CONVERTERS;

EID: 84893810472     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSCIRC.2003.1257173     Document Type: Conference Paper
Times cited : (30)

References (13)
  • 2
    • 0001827605 scopus 로고
    • Photoluminescence lifetime microscope spectrometer based on time-correlated single-photon counting with an avalanche diode detector
    • T. A. Louis, G. Ripamonti, and A. Lacaita, "Photoluminescence lifetime microscope spectrometer based on time-correlated single-photon counting with an avalanche diode detector", Rev. Sci. Instrum. 61, 11-22 (1990).
    • (1990) Rev. Sci. Instrum , vol.61 , pp. 11-22
    • Louis, T.A.1    Ripamonti, G.2    Lacaita, A.3
  • 6
    • 0033279234 scopus 로고    scopus 로고
    • A 250-ps time-resolution cmos multihit time-to-digital converter for nuclear physics experiments
    • F. Bigongiari, R. Roncella, R. Saletti, P. Terreni, A 250-ps Time-Resolution CMOS Multihit Time-to-Digital Converter for Nuclear Physics Experiments, IEEE Transactions on Nuclear Science, Vol. 46, No 2, 1999.
    • (1999) IEEE Transactions on Nuclear Science , vol.46 , Issue.2
    • Bigongiari, F.1    Roncella, R.2    Saletti, R.3    Terreni, P.4
  • 7
    • 84893715115 scopus 로고    scopus 로고
    • A high resolution digital cmos time-to-digital converter based on nested dlls
    • A. Mantyniemi, T. Rahkonen, J. Kostamovaara, A High Resolution Digital CMOS Time-to-Digital Converter Based on Nested DLLs, IEEE, 1999.
    • (1999) IEEE
    • Mantyniemi, A.1    Rahkonen, T.2    Kostamovaara, J.3
  • 13
    • 0034270347 scopus 로고    scopus 로고
    • A cmos pulse-shrinking delay element for time interval measurement
    • P. Chen, S. Liu, J. Wu, A CMOS Pulse-Shrinking Delay Element For Time Interval Measurement, IEEE Transactions on Circuit and Systems-II, Vol. 47, No 9, 2000.
    • (2000) IEEE Transactions on Circuit and Systems-II , vol.47 , Issue.9
    • Chen, P.1    Liu, S.2    Wu, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.