A CMOS IC for X-ray computed tomography

European Solid-State Circuits Conference

Volumn , Issue , 1998, Pages 224-227

  Huang, Qiuting ^a   Biber, Alice ^b   Oberle, Michael ^a  

^a ETH ZURICH   (Switzerland)

^b CSEM   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CDTE DETECTOR; FLICKER NOISE CORNER FREQUENCY; FULLY INTEGRATED; NARROW PULSE WIDTHS; NOISE SPECTRAL DENSITY; VOLTAGE PULSE; X-RAY COMPUTED TOMOGRAPHY; X-RAY TOMOGRAPHY;

WHITE NOISE;

EID: 84893733946     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSCIR.1998.186249     Document Type: Conference Paper

References (6)

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2. A. Glasow et al, "Aspects of Semiconductor Current Mode Detectors for X-ray Computed Tomography", IEEE Trans. on Nuclear Science, Vol. NS-28, No.1, pp.563-571, Feb. 1981
3. F. Goulding and D. Landis, "Signal Processing for Semiconductor Detectors", IEEE Trans. on Nuclear Science, Vol. NS-29, No.3, pp.1125-1141, June 1982
4. E. Heijne and P. Jarron, "A Low Noise CMOS Integrated Signal Processor for Multi-Element Particle Detectors", Proc. ESSCIRC'88, pp. 66-69, Manchester, UK, Sept. 1988
5. P. Fessler et al, "An ultra low noise multichannel integrated readout for X-rays multi-detectors", Nuclear Instruments and Methods in Physics Research A346 (1994), pp.213-219, North Holland
6. U. Schoeneberg et al, "A CMOS Readout System for Very Large Detector Capacitances", Nuclear Instruments and Methods in Physics Research A288 (1990), pp.191-196, North Holland