Deterministic BIST with partial scan

Proceedings - European Test Workshop 1999, ETW 1999

Volumn , Issue , 1999, Pages 110-116

  Kiefer, Gundolf ^a   Wunderlich, Hans Joachim ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FLIP FLOP CIRCUITS;

DETERMINISTIC BIST; HARDWARE OVERHEADS; ON CHIPS; PARTIAL SCAN; PATTERN GENERATOR; SELECTION ALGORITHM;

HARDWARE;

EID: 84893679109     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.1999.804415     Document Type: Conference Paper

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